Advantest Introduces EVA100 Measurement System for Testing Analog, Mixed-Signal and Sensor ＩＣs
27 Maggio 2014 - 9:05AM
Marketwired
Advantest Introduces EVA100 Measurement System for Testing Analog,
Mixed-Signal and Sensor ＩＣs
New Test Solution Integrates Multiple Capabilities to Support
Device Testing from Engineering to the Production Floor
TOKYO, JAPAN--(Marketwired - May 27, 2014) - Leading
semiconductor test equipment supplier Advantest Corporation (TSE:
6857) (NYSE: ATE) has released its new EVA100 measurement system,
an evolutionary value-added platform that combines digital and
analog testing capabilities to handle small-pin-count analog,
mixed-signal and sensor semiconductors.
The EVA100's expandable architecture provides the flexibility to
conduct a wide range of measurement functions. Operation is highly
intuitive, alleviating the need for users to have advanced
programming skills and helping customers to get their latest ICs to
market faster.
Designed for use in both engineering and volume-production
environments, the EVA100 allows simultaneous control of multiple
test functions to achieve highly precise measurements and improve
testing efficiency. By integrating analog-voltage and
current-source measurements, an eight-channel, 100-Mbps pattern
generator and an oscilloscope in one compact, lightweight system,
the EVA100 also eliminates the need for complicated cabling to
connect and coordinate the various instruments.
"Analog and mixed-signal ICs are critically important in
enabling the increasing performance, higher accuracy and longer
reliability of today's smart electronics," said Satoru Nagumo,
executive officer of Advantest Corporation. "Our new monolithic
test solution eliminates the high cost, complex set up and long
lead times required when using several kinds of measurement
instruments to test these devices."
About Advantest
Corporation A world-class technology company, Advantest is
the leading producer of automatic test equipment (ATE) for the
semiconductor industry and a premier manufacturer of measuring
instruments used in the design and production of electronic
instruments and systems. Its leading-edge systems and products
are integrated into the most advanced semiconductor production
lines in the world. The company also focuses on R&D for
emerging markets that benefit from advancements in nanotech and
terahertz technologies, and has introduced multi-vision metrology
scanning electron microscopes essential to photomask manufacturing,
as well as a groundbreaking 3D imaging and analysis
tool. Founded in Tokyo in 1954, Advantest established its
first subsidiary in 1982, in the USA, and now has subsidiaries
worldwide. More information is available at
www.advantest.com.
Judy Davies Email Contact 408-456-3717
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