Onto Innovation Invites Customers and Investors to Schedule Meetings at SEMICON® West
20 Giugno 2024 - 9:15PM
Business Wire
Onto will exhibit at SEMICON West July 9-11 at
Booth 633 in the South Hall of Moscone Center
Onto Innovation Inc. (NYSE: ONTO) today announced it will be
exhibiting at SEMICON West on July 9-11, 2024. Onto Innovation
invites customers to booth 633 to learn about the Company’s latest
portfolio of integrated process and process control solutions being
used to support its customers’ ramp of AI products. Onto will
feature a selection of its latest technologies helping to enable
advanced packaging, including lithography for next generation AI
and chiplet designs employing cutting edge panel-level production
technologies (CCL and glass handling) and unique 3D metrology and
inspection capabilities in support of next generation bump
technologies. In addition, Onto will feature metrology solutions
for advanced node logic (CPU/GPU) and memory (HBM, DRAM and NAND)
applications; and a range of technologies for the production of
specialty devices, including those for GaN and SiC, powering the
advanced automotive market and electric vehicles. Onto’s product
experts will be at the booth to answer specific applications
questions.
To schedule a customer meeting, please contact Onto at
info@ontoinnovation.com.
The Onto Innovation management team is looking forward to
holding investor meetings during the SEMICON West show at the
InterContinental San Francisco, 888 Howard Street.
To schedule an investor meeting, please contact Sidney Ho at
Sidney.ho@ontoinnovation.com.
In addition to the exhibit booth and meetings, please join Onto
for two technical presentations in the program featuring Onto’s
enterprise software. In the Smart Manufacturing Pavilion, Onto’s
software expert Prasad Bachiraju will present Achieving Zero Defect
Manufacturing in Semiconductor Fabs on Wednesday, July 10, at 11:00
a.m. PT in Moscone South at the Smart Manufacturing Pavilion Stage.
On the TechTALKS stage, Onto’s Bryce Chi will present Using Deep
Learning ADC for Defect Classification for Automatic Defect
Inspection on Thursday, July 11, at 2:35 p.m. PT in Moscone South,
Exhibition Level, Room 7.
About Onto Innovation Inc.
Onto Innovation is a leader in process control, combining global
scale with an expanded portfolio of leading-edge technologies that
include: Un-patterned wafer quality; 3D metrology spanning chip
features from nanometer scale transistors to large die
interconnects; macro defect inspection of wafers and packages;
metal interconnect composition; factory analytics; and lithography
for advanced semiconductor packaging. Our breadth of offerings
across the entire semiconductor value chain combined with our
connected thinking approach results in a unique perspective to help
solve our customers’ most difficult yield, device performance,
quality, and reliability issues. Onto Innovation strives to
optimize customers’ critical path of progress by making them
smarter, faster and more efficient. With headquarters and
manufacturing in the U.S., Onto Innovation supports customers with
a worldwide sales and service organization. Additional information
can be found at www.ontoinnovation.com.
Source: Onto Innovation Inc. ONTO-IC
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version on businesswire.com: https://www.businesswire.com/news/home/20240620878727/en/
Investor Relations: Sidney Ho, +1 408.376.9163
Sidney.ho@ontoinnovation.com
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